Past Events

Past Top

• 5th Erlangen TEM-School 2015

  23 to 26 March 2015
  CENEM – Erlangen – Germany

  Flyer

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• 42nd Annual Meeting of the Society for Cutaneous Ultrastructure Research (SCUR)

  12 to 14 March 2015
  Mannheim – Germany

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• NIBSC / JEOL / LEICA / Gatan CryoEM –Workshop

  02 to 06 March 2015
  NIBSC Imaging laboratory, Potters Bar – London – United Kingdom

  Flyer

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• EM and CryoEM workshop @ Technion

  22 to 25 February 2015
  Haifa – Israel

  EMS sponsored lecture in Haifa

  • Louisa Meshi (Beer-Sheva University, Department of Materials Engineering, Israel)
  • “Introduction to Crystallography”

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• Basic course cryosectioning and Immuno-gold labeling of thawed frozen sections (Tokuyasu technique)

  23 to 26 January 2015
  UMC – Utrecht – Netherlands

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• Basic course resin embedding and ultrathin sectioning

  19 to 21 January 2015
  UMC – Utrecht – Netherlands

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• Winterschool 2015, Practical course in advanced 3D microscopy

  18 to 23 January 2015
  Zurich – Switzerland

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• UK Facility Managers Meeting

  05 and 06 January 2015
  MRC laboratory of Molecular Biology – Cambridge – United Kingdom

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• A new approach to organize and search image data: Huygens Titan

  03 December 2014
  

  Speaker:
  - Dr. Vincent Schoonderwoert (Scientific Volume Imaging, Hilversum, The Netherlands
  Organiser: Scientific Volume Imaging

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• Solving Analysis Problems with Micro-XRF

  20 November 2014
  

  Speakers:
  - Dr. Bruce Scruggs, Product Manager Micro-XRF, EDAX
  - Andrew Lee, Senior Applications Engineer Micro-XRF, EDAX
  Organiser: EDAX

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• Innovations in Light Sheet Microscopy : Strategies and New Applications

  29 October 2014
  

  Speakers:
  - Thai Truong, Ph. D (University of Southern Carolina, Los Angeles, CA)
  - Peter G. Pitrone, DipRMS (MPI-CBG Dresden, Germany)
  - Dr Orla Hanrahan, Ph. D (Andor Technology, Belfast)
  Organiser: Andor Technology
  Full Webinar Details

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• Second Conference on In-Situ and Correlative Electron Microscopy

  14 and 15 October 2014
  Saarbrücken – Germany

  EMS sponsored lecture in Saarbrücken

  • Wolfgang Baumeister (Max-Planck-Institute of Biochemistry, Martinsried/Germany)
  • “Electron Cryomicroscopy ex situ and in situ”

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• Compositional and structural characterisation of devices based on nanolayers and 2D materials in the SEM

  18 September 2014
  

  Speakers:
  - Dr. Christian Lang, Business Manager Nanoanalysis Solutions, Oxford Instruments
  - Dr. Peter Statham, Director of Research, Oxford Instruments
  Organiser: : Oxford Instruments

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• XV International Conference on Electron Microscopy

  15 to 18 September 2014
  Cracow – Poland

  EMS sponsored lecture in Kraków

  • Bart Goris (University of Antwerp)
  • “High resolution 3D imaging of nanomaterials”
  • Paul Midgley (University of Cambridge)
  • “New Developments in Electron Crystallography: Molecular Motion and 3D Orientation Mapping”

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• 9th International conference on charged particle optics (CPO)

  31 August to 05 September 2014
  Brno – Czech Republic

  EMS sponsored lecture in Brno

  • Gerd Schoenhense (Johannes Gutenberg University Mainz )
  • “Fast k-space tomography of electronic bands using time-of-flight based cathode-lens microscopy”
  • Rudolf M. Tromp (IBM Watson Center, Yorktown Heights)
  • “Towards 1.5λ resolution with low energy electrons”

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• Specimen preparation course

  31 July 2014
  University – Linköping – Sweden

  EMS sponsored lecture in Linköping

  • Linda Sandblad (Department of Molecular Biology, Umeå University)
  • “An introduction to cryo EM methods - plunge freezing, high pressure freezing and close to native visualisation”
  • Yaron Kauffmann (Technion’ Israel Institute of Technology)
  • “Improving FIB prepared TEM samples using very low energy ion mill polishing”

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• Seeing Materials in Motion: Why Today’s Researchers Need Dynamic Characterization

  15 July 2014
  

  Speaker:
  - Dr. Daniel Phifer, Product Marketing Engineer
  Organiser: FEI

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• Summer School on Advanced Aberration-Corrected STEM

  04 to 07 July 2014
  Daresbury – United Kingdom

  EMS sponsored lecture in Daresbury

  • Rolf Erni (Electron Microscopy Center, EMPA - Swiss Federal Laboratories for Materials Science and Technology, Dubendorf, Switzerland)
  • “Low-loss Electron Energy Loss Spectroscopy”

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• Innovative ‘Flash-And-Freeze’ Fixation Method for EM

  17 June 2014
  

  Speakers:
  - Prof. Erik Jorgensen, Professor in the Department of Biology at the University of Utah and investigator of Howard Hughes Medical Institute
  - Shigeki Watanabe, Post-doctoral fellow in the laboratory of Erik Jorgensen and is a visiting scholar at the Universitätzmedizin Berlin, Germany
  Organiser: Leica Microsystems

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• Joint EELS-EDS Spectrum Imaging for Fast-Mapping and Atomic Scale Analysis

  12 June 2014
  

  Speaker:
  - Dr. Paolo Longo, Applications Scientist, Gatan, Inc.
  Organiser: Gatan

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• Workshop on Electron Wave Imaging (Holo-Workshop)

  09 to 13 June 2014
  Dresden – Germany

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• Innovative preparation method of heterogeneous materials for near-perfect EM observation

  27 May 2014
  

  Speakers:
  - Dr. Gang Ji, Ph.D. in Materials Science, Lille University
  - Dr. Wolfgang Grünewald, Application Specialist, Solid states, Leica Microsytems – Nanotechnology Division
  Organiser: Leica Microsystems

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• Simplifying complex imaging experiments by intuitive graphical interfaces

  22 May 2014
  

  Speakers:
  - Flavio Giacobone, Product Manager Software, Micro-Imaging Solutions Division, Olympus Europa SE & Co. KG
  - Dr. Jan Barghaan, Product Manager Software Solutions, Micro-Imaging Solutions Division, Olympus Europa SE & Co. KG
  Organiser: Olympus Europa SE

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• 3D Electron Microscopy: From Molecule to Organism

  22 and 23 May 2014
  UPMC – Paris – France

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• 20-Minute Presentation in X-ray Microanalysis: PCA Eliminates Errors and Saves Time

  13 May 2014
  

  Speaker:
  - Steven Seddio, Application Scientist, Thermo Fisher
  Organiser: Thermo Fisher Scientific

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• Non-destructive Analysis of Historical Paintings with Spatially Resolved XRF

  30 April 2014
  

  Speakers:
  - Prof. Dr. Joris Dik, Antoni van Leeuwenhook Chair, Materials in Art and Archeology, Delft University of Technology
  - Dr. Andreas Wittkopp, Business Manager, Micro-XRF - EMEA Region, Bruker Nano
  Organiser: Bruker Nano Analytics

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• Electron Crystallography School - Introduction to electron diffraction tomography

  07 to 11 April 2014
  Darmstadt – Germany

  EMS sponsored lecture in Darmstadt

  • Louisa Meshi (Beer-Sheva University Israel, Department of Materials Engineering)
  • “Introduction to Crystallography”

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• Ensuring Color Integrity with Datacolor CHROMACAL in Brightfield Microscopy Imaging

  02 April 2014
  

  Speaker:
  - Mark McNulty, Global Director and General Manager - Datacolor Scientific
  Organiser: Bruker Nano Analytics
  Online Flyer
  Website

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• Ensuring Color Integrity with Datacolor CHROMACAL in Brightfield Microscopy Imaging

  02 April 2014
  

  Speaker:
  - Mark McNulty, Global Director and General Manager - Datacolor Scientific
  Organiser: Electron Microscopy Sciences and Datacolor Scientific
  Online Flyer
  Website

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• Quantitative image analysis in microscopy

  02 April 2014
  

  Speaker:
  - Markus Fabich, Product and Application Specialist Metrology, Quantitative image analysis in microscopy, Olympus Europa
  Organiser: Olympus

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• EMBO Practical Course in Advanced Optical Microscopy

  02 to 12 April 2014
  Plymouth – United Kingdom

  EMS sponsored lecture in Plymouth

  • Sid Shaw (Indiana University)
  • “Imaging Methods in Plant Development”

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• Advancing Feature Analysis and Spectrum Imaging in Scanning Electron Microscopy

  26 March 2014
  

  Speaker:
  - Dr. Tobias Salge, Senior Application Scientist EDS, Bruker Nano Analytics
  Organiser: Bruker Nano Analytics

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• Investigations of Lifestyle Diseases: Discover Raman Imaging for your Biomedical & Pharmaceutical Research

  26 March 2014
  

  Speakers:
  - Andrea Jauss, Senior Application Scientist, WITec GmbH
  - Dr. Thomas Dieing, Director, Customer Support and Applications, WITec GmbH
  Organiser: WITec GmbH

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• Advanced EBSD Applications Webinar: In-situ EBSD Phase Transformation and Recrystallisation

  19 March 2014
  

  Speakers:
  - Dr. Jenny Goulden, EBSD Business Manager, Oxford Instruments
  - Dr. Neil Othen, Product Manager, Gatan UK
  - Dr. Ali Gholinia, Research Fellow, Manchester University
  Organiser: Oxford Instruments

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• New Dimensions in Super-Resolution Microscopy

  19 February 2014
  

  Speakers:
  - Dr. Timo Zimmermann, Head of the Advanced Light Microscopy Unit, CRG-Centre for Genomic Regulation, Spain
  - Dr. Eric Hosy, CNRS, University of Bordeaux, France
  Organiser: Leica Microsystems

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• Focused ion beam fabrication of resonant antennas for nanoscale imaging

  12 February 2014
  

  Speakers:
  - Rainer Hillenbrand, Ikerbasque Research Professor and Group Leader at CIC nanoGUNE
  - Laurent Roussel, Product Marketing Manager SEM/DualBeam, FEI
  - Baptiste Gault (Moderator), Materials Science Publisher
  Organiser: Materials Today

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• Advances in X-ray Elemental and Phase Mapping

  29 January 2014
  

  Speaker: Tara Nylese, Global Applications Manager, EDAX
  Organiser: EDAX Inc

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• Preparing the highest quality S/TEM samples with DualBeam technology

  17 December 2013
  

  Speaker: Brandon Van Leer, Product Marketing Engineer, FEI Company
  Organiser: FEI

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• Advanced Compositional Analysis of Metals and Materials using Analytical S/TEM

  12 November 2013
  

  Speaker: Oleg Lourie, Product Marketing Manager TEM
  Organiser: FEI

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• High Speed AFM-Raman Optimized for Nanoscale Chemical Imaging: Making TERS An Accessible Technique

  12 November 2013
  

  Speakers:
  - Emmanuel Leroy, AFM-Raman Product Manager, HORIBA Scientific
  - Andrey Krayev, Chief Technology Officer, AIST-NT
  Organiser: HORIBA Scientific

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• Highest Resolution Confocal Raman – AFM – SNOM: New insights for Graphene and Nano-Materials

  24 October 2013
  

  Speakers:
  - Dr. Ute Schmidt, Applications Manager, WITec GmbH, Ulm, Germany
  - Dr. Thomas Dieing, Director, Customer Support and Applications, WITec GmbH, Ulm, Germany
  Organiser: WITec GmbH

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• High-Speed Multiphoton Microscopy – FluoView FVMPE-RS

  23 October 2013
  

  Speakers:
  - Dr. Bulent Peker, Product Manager Laser Scanning Microscopes, Olympus Europa SE & Co. KG
  - Dr. Florian Eich, Group Leader Product & Application Support, Olympus Europa SE & Co. KG
  Organiser: Olympus Europa SE

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• Standardized Quantitative Data with EDS and WDS

  22 October 2013
  

  Speaker: Chris Stephens, Microanalysis Applications Specialist, Thermo Fisher Scientific
  Organiser: Thermo Fisher Scientific

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• European Atom Probe Tomography Workshop

  21 to 23 October 2013
  ETH Zurich/EMEZ – Zurich – Switzerland

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• Correlative Light Electron Microscopy: 1 + 1 = 3

  15 October 2013
  

  Speaker: Dr. Paul Verkade, Chair of the Cryo Microscopy Group, Bristol University
  Organiser: Leica Microsystems
  Link to on-demand video: http://view6.workcast.net/?pak=5033480577792095

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• Microscopy at the Frontiers of Science 2013

  17 to 20 September 2013
  Tarragona – Spain

  EMS sponsored lecture in Tarragona

  • Georg Schitter (Automation and Control Institute (ACIN), Vienna University of Technology, Austria)
  • “Mechatronics and Instrumentation for High-speed High-Resolution imaging systems”
  • Yeshayahu (Ishi) Talmon (Technion-Israel Institute of Technology, Haifa, Israel)
  • “The Latest in Cryo-EM”

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• Electron Microscopy and Analysis Group Conference / Archie Howie Symposium on in-situ microscopy

  03 to 06 September 2013
  York – United Kingdom

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• Microscopy Conference MC 2013

  25 to 30 August 2013
  Regensburg – Germany

  Organization: DGE, ASEM, SSOM, CSEM, CSMS, HSM, SDM, SISM, SSM, TEMD
  

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• 26th bi-annual International Conference on Photochemistry

  21 to 26 July 2013
  Leuven – Belgium

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• Enhanced Data Generated by Electrons 2013

  26 to 31 May 2013
  Sainte-Maxime – France

  EMS sponsored lecture in Sainte-Maxime

  • Joanne Etheridge (Dept of Materials Engineering, Monash Centre for Electron Microscopy, Monash University)
  • “Quantitative Methods for the Determination of Nanostructures using Focused Electron Probes”

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